structure evolution of polyethylene-plasticizer film

  • structure evolution of polyethylene-plasticizer film

    Structure evolution of polyethylene-plasticizer film

    Structure evolution of slightly oriented high density polyethylene (HDPE)-plasticizer film is recorded with small- and wide- angle X-ray scattering (SAXS/WAXS) during stretching. The HDPE has number average molecular weight ( M n ) of 300 kg/mol and polydispersity index ( M w / M n ) of 20, respectively.

  • structure evolution of polyethylene-plasticizer film

    Structure evolution of polyethylene-plasticizer film

    Structure evolution of slightly oriented high density polyethylene (HDPE)-plasticizer film is recorded with small- and wide- angle X-ray scattering (SAXS/WAXS) during stretching. The HDPE has number average molecular weight (M n) of 300 kg/mol and polydispersity index (M w /M n) of 20, respectively. The plasticizer is mixture of aliphatic

  • structure evolution of polyethylene-plasticizer film

    Structure Evolution of Polyethylene-Plasticizer Film

    Request PDF | Structure Evolution of Polyethylene-Plasticizer Film at Industrially Relevant Conditions Studied by in-situ X-ray Scattering: the Role of Crystal Stress | Structure evolution of

  • structure evolution during deposition and thermal annealing

    Structure evolution during deposition and thermal annealing

    The evolution of the structure of amorphous carbon (a-C) films during deposition and thermal annealing is of significant interest from both the materials science and application perspectives.

  • lingpu meng's research works | university of science

    Lingpu Meng's research works | University of Science

    Structure Evolution of Polyethylene-Plasticizer Film at Industrially Relevant Conditions Studied by in-situ X-ray Scattering: the Role of Crystal Stress Article Feb 2018

  • amorphous phase modulus and micro–macro scale relationship

    Amorphous Phase Modulus and Micro–Macro Scale Relationship

    Structure evolution of polyethylene-plasticizer film at industrially relevant conditions studied by in-situ X-ray scattering: The role of crystal stress. European Polymer Journal 2018, 101, 358-367. DOI: 10.1016/j.eurpolymj.2018.02.001. Bijin Xiong, Olivier Lame, Roland Seguela, Yongfeng Men.

  • temperature dependence of the crystal lattice modulus and the

    Temperature dependence of the crystal lattice modulus and the

    Structure evolution of polyethylene-plasticizer film at industrially relevant conditions studied by in-situ X-ray scattering: The role of crystal stress. European Polymer Journal 2018, 101, 358-367. DOI: 10.1016/j.eurpolymj.2018.02.001.

  • دانلود مقالات isi پلی اتیلن: 1334 مقاله isi انگلیسی + ترجمه فارسی

    دانلود مقالات ISI پلی اتیلن: 1334 مقاله isi انگلیسی + ترجمه فارسی

    Structure evolution of polyethylene-plasticizer film at industrially relevant conditions studied by in-situ X-ray scattering: The role of crystal stress.

  • growth model and structure evolution of ag layers deposited

    Growth model and structure evolution of Ag layers deposited

    Crystalline structure of Ag layers grown on Ge wetted silica substrates. Figure 1 presents the XRD spectra of the investigated silver films. In each case, there is a strong diffraction peak at 38.2°, which corresponds to the (111) plane spacing.

  • lpcvd polycrystalline silicon thin films: the evolution

    Lpcvd Polycrystalline Silicon Thin Films: The Evolution

    Lpcvd Polycrystalline Silicon Thin Films: The Evolution of Structure, Texture and Stress - Volume 202 - P. Krulevitch, Tai D. Nguyen, G. C. Johnson, R. T. Howe, H. R

  • structure evolution of slag films of ultrahigh-basicity mold

    Structure Evolution of Slag Films of Ultrahigh-Basicity Mold

    A higher-basicity mold flux (binary basicity 1.74) for peritectic grades showed similar solidification behavior to conventional high-basicity fluxes. Upon solidification of the mold flux onto a water-cooled copper probe, interfacial roughness at the copper-mold flux interface developed, while the film was glassy.

  • structure formation and evolution in semiconductor films

    Structure formation and evolution in semiconductor films

    Structure formation and evolution in semiconductor films for perovskite and organic photovoltaics - Volume 32 Issue 10 - Andrew J. Pearson Skip to main content Accessibility help We use cookies to distinguish you from other users and to provide you with a better experience on our websites.

  • stress and structure evolution during volmer-weber growth

    Stress and structure evolution during Volmer-Weber growth

    A computer simulation of thin film formation by the Volmer-Weber mechanism was developed to model the nucleation and growth of individual islands that impinge and coalesce to form a continuous film. By including a size-dependent lattice contraction in pre-coalescence islands, the simulation can be used to qualitatively reproduce the measured

  • rigaku materials analysis enewsletter - april 2018

    Rigaku Materials Analysis eNewsletter - April 2018

    New insights into microstructural evolution of epitaxial Ni–Mn–Ga films on MgO (1 0 0) substrate by high-resolution X-ray diffraction and orientation imaging investigations. Sharma, Amit; Mohan, Sangeneni; Suwas, Satyam. Philosophical Magazine. Apr2018, Vol. 98 Issue 10, p819-847. 29p. DOI: 10.1080/14786435.2017.1418094.